Used AMAT / APPLIED MATERIALS UVision 7 #293665711 for sale

AMAT / APPLIED MATERIALS UVision 7 is an advanced mask and wafer inspection equipment designed for advanced semiconductor device manufacturing. It is equipped with a compact optical microscopy (COM) system to provide higher resolution images of the wafer and mask patterns for precise inspection. It is designed to accurately inspect and check for minute defects and variations for a wide range of materials and applications. The unit is composed of three main components - the illumination machine, the optics & image capture tool, and the imaging & control asset. The illumination model is responsible for evenly distributing uniform, high intensity UV or visible light over the entire wafer or mask, which is necessary in order to accurately capture the structures and patterns on the wafer/mask. The optics & image capture equipment is made up of a CCD camera and the optics, which captures the image of the wafer/mask pattern. The imaging & control system allows users to control the exposure of the image, the focus of the image, and the resolution, intensity, and spectral range of the image. AMAT UVision 7 is designed with high levels of accuracy and precision in mind, and can inspect devices with dimensions as small as 0.02 microns. It also contains multi-layer alignment systems to accurately register the inspection results with each device structure. The unit is also equipped with automated defect detection algorithms that can accurately detect defects, contaminants, and non-functional areas of the pattern. Additionally, APPLIED MATERIALS UVision 7 is compatible with a variety of layout formats and has a user friendly interface that allows easy manipulation of the machine. Overall, UVision 7 is a powerful and versatile mask and wafer inspection tool that is designed to provide fast and accurate inspections for semiconductor devices of virtually any size or complexity. It is built with advanced imaging & capture systems, comprehensive control systems, and automated defect detection and registration systems to ensure that high quality images are accurately captured and highly accurate inspections are performed.