Used AMAT / APPLIED MATERIALS Vericell HT #9293298 for sale

AMAT / APPLIED MATERIALS Vericell HT (High Throughput) is a Mask & Wafer Inspection Equipment that supports microlithography operations, including high-throughput production and research & development. The system is designed to provide rapid, accurate imaging and analysis of micro-devices. The unit offers integrated pattern recognition, defect categorization and measurement capabilities, enabling researchers and technicians to quickly and accurately characterize device quality, yield, and reliability. It also supports a variety of image processing, measurement and analysis functions. AMAT Vericell HT uses advanced optical imaging, automated defect inspection, as well as comprehensive pattern recognition capabilities to provide a comprehensive and automated device inspection suite. The machine is fully featured and user-friendly, with a large touchscreen monitor and graphical user interface. It supports automated exposure, light calibration, and image data acquisition for a wide range of sample types, including thin films, substrates, and complex patterned semiconductor devices. APPLIED MATERIALS Vericell HT's analytical capabilities include multiple image processing modules, high-resolution defect inspection and analysis, and advanced pattern recognition. It uses intuitive controls, adjustable settings, and high-speed data processing. The tool's advanced defect detection capabilities help identify subtle defects, production variations, and other problematic features, which may result in process or yield problems. It provides not only detection of critical defects, but also comprehensive defect analysis, enabling users to identify and remediate process issues. Additionally, the asset is equipped with active metrology functions, allowing users to conduct on-the-fly performance checks, analysis of device parameters, and on-site inspection for process improvement. Overall, Vericell HT is a versatile and powerful mask & wafer inspection model with an array of features and capabilities, enabling users to inspect micro-devices quickly, accurately, and with minimal operator effort. It is designed to improve process reliability and yields, making it an efficient tool for mask & wafer manufacturing.