Used AMAT / APPLIED MATERIALS WF 736 XS #9159817 for sale

AMAT WF 736 XSmask & wafer inspection equipment is designed for high-speed production applications, providing productive and accurate detection of particles and defects. It is a single- or dual-view system that performs real-time particle and defect inspection of a wide range of wafer sizes at high throughput. The unit is equipped with a high power ultra violet (UV) and brightfield lamp machine, enabling users to generate significantly more information about defects and particles in a single scan. This two-in-one configuration provides maximum detection sensitivity for inspecting at speeds up to 3,500 wafers per hour. The tool has an automated alignment process with an embedded vision asset and a vacuum wafer interface. This ensures precise, consistent, and repeatable wafer inspection. The physical inspection model offers an efficient chip-to-chip range of view capabilities, making it capable of detecting particle and defect density along the chip edge. The equipment provides a hardware-in-the-loop feature for robot-assisted wafer handling. This allows for shorter cycle time, improved throughput, and high-precision efficient wafer handling. Moreover, the WF-736 has a graphical user interface (GUI) for rapid, user-friendly setup. It has an embedded process control center which provides centralized management of multiple stations. The system also has comprehensive data acquisition tools for monitoring, displaying, and archiving process data. It supports up to 6 inspection axes and is extendable to control up to 16 axes. The unit has built-in traceability feature enabling real-time record/replay of the scan history from different locations. This helps the operator find the defects and its location. It also has an on-board recipe storage and transfer memories for easy transfer of customer recipes and programs. Additionally, the machine is compatible with Applied Metallization 5020 software for defect recognition and classification. This enables faster and smoother processes and provides faster response time to user input. All in all, APPLIED MATERIALS WF 736 XSmask & wafer inspection tool is an efficient and accurate solution for production applications. It offers excellent particle and defect detection, fast and flexible operation, and easy setup for users. The combination of high-speed scanning, automated alignment, and advanced vision asset makes it a reliable choice for production environments.