Used AMAT / APPLIED MATERIALS WF 736 #9160732 for sale

AMAT / APPLIED MATERIALS WF 736 is a mask and wafer inspection equipment designed to facilitate the identification and analysis of defects in semiconductor devices. It is built on a platform that is user-friendly and offers a wealth of automated features to streamline the inspection process. The system is designed for use in both production and development environments, and is capable of capturing images of device surfaces with resolutions up to 1600x1280 pixels. It has a large display area of 30-inch, full HD resolution and a 4K external display for previewing images. The unit is equipped with high-end optics and a highly sensitive color camera machine featuring true three-color imaging, allowing users to identify and inspect defects quickly and accurately. Additionally, the tool is armed with a laser to analyze defects down to 0.1 μm2. Utilizing a boom-mounted 8x objective, the asset is designed for two-dimensional imaging, ensuring that the highest resolution images can be captured and stored for further analysis. It also permits fast scanning of masks and wafers to detect and measure small defects. AMAT WF 736 offers powerful defect inspection software, built using advanced algorithms. Its pattern detection feature makes it easy to detect and pinpoint any defects on a mask or wafer. It also supports real-time measurement, allowing users to identify and quantify defects rapidly. In addition, the software comes with quick-optimization capabilities, allowing users to analyze their images quickly and efficiently. The model is integrated with a software suite that enables an efficient workflow. It provides an automated workflow based upon parameters set by the user. This software helps to streamline the data analysis and reporting process, enabling users to easily analyze and track their data over time. APPLIED MATERIALS WF 736 is a well-designed equipment capable of carrying out high-precision inspection of mask and wafers. It offers fast, accurate results and provides users with the tools necessary to quickly detect and quantify defects. The robust design, intuitive interface and powerful data analysis capabilities make this system a great choice for those looking to inspect masks and wafers in detail.