Used ANDA TESA-uHITE PIM 100 #9222760 for sale

ANDA TESA-uHITE PIM 100
ID: 9222760
Wafer thickness measuring system.
ANDA TESA-uHITE PIM 100 is a versatile mask and wafer inspection equipment that is well-suited for use in various applications. This system utilizes a state-of-the-art integrated imaging technology to quickly and accurately detect and measure defects in the surface of wafers, masks, and displays. It can also be used to inspect a range of materials, such as semiconductors, thin film transistors, LEDs, and other components. The core component of TESA-uHITE PIM 100 is its imaging technology. This technology is based on CCD (Charge Coupled Device) and achromatic lens optics, which are capable of both daylight and infrared light emission. This allows for high-accuracy surface inspection of various materials. Additionally, the unit is capable of inspecting wafers of different sizes, ranging from 200mm to 820mm. In addition to its imaging capabilities, ANDA TESA-uHITE PIM 100 also includes a number of advanced software features, including dynamic image recognition, 3D image analysis, and multi-image comparison. These features allow the machine to identify defects at a much deeper level than a traditional vision tool, helping to reduce rework and material loss. Furthermore, the asset's built-in tracking and logging features enable the inspection results to be stored and analyzed for future assessment. TESA-uHITE PIM 100 also offers a range of versatility in terms of its control environment. It is capable of receiving both minute and detailed control commands from both manual and PC operation. Additionally, it is equipped with a comprehensive set of safety features, including resistive touch protection and on/off switches, ensuring protection from electric shock or fire when using the model. To further improve the performance of the equipment, ANDA TESA-uHITE PIM 100 also features a built-in network port, allowing users to communicate with external systems. This is especially useful when used in larger setups, allowing users to remotely access the system for centralized control. Overall, TESA-uHITE PIM 100 is an extremely reliable and powerful unit for surface inspection of wafers, masks, and displays. Its advanced imaging technology allows for quicker and more accurate defects detection to reduce materials loss and rework, while its versatile control environment makes it suitable for various applications. Furthermore, its built-in safety features ensure a safe and secure environment when using the machine.
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