Used ASM IBE 139 #293637813 for sale

ASM IBE 139 is a full-featured mask and wafer inspection equipment that offers precise and ultra-clear image analysis of semiconductor wafers and masks. It is designed to accurately detect the placement of individual transistors and components during the production process and to locate potential defects. This system provides an effective tool for quickly identifying potential problems before they become major production roadblocks. ASM IBE139 features a powerful optical microscope unit equipped with a strong digital imaging processor that facilitates precise, high-magnification imaging of wafers and masks. The microscope is mounted on a motorized XYZ stage and is designed to take image samples from sections as small as a few microns. In addition, this microscope utilizes a high-sensitivity, high-dynamic-range CCD camera for capturing images of outer layers of the semiconductor wafers, as well as layers beneath the surface. To further facilitate accurate defect identification and analysis, IBE 139 is equipped with a powerful image processing engine that utilizes advanced algorithms to accurately identify and magnify defects. These algorithms enable the machine to quickly compare the image samples against a database of clean wafer images, effectively detecting any variations or irregularities. The tool also enables detailed vector analysis of the differences between different levels of images, allowing it to identify and isolate even the smallest of defects. In addition to its powerful imaging processor, IBE139 also features an intuitive user interface that allows users to quickly and easily control and monitor the asset. The model features an integrated data manager that enables functions such as defect localization, annotation, and automated test pattern recognition. This enables the user to quickly isolate the portions of the wafer or mask that need to be subjected to further testing and analysis. The equipment also features real-time alerting capabilities, enabling it to quickly notify users of detected production issues. ASM IBE 139 also offers enhanced performance, reliability, and efficiency of operation. The system utilizes a proprietary hardware platform designed to ensure reliable operation and long-term durability. Furthermore, the unit can be easily integrated with various software tools to facilitate automation of wafer and mask inspections, including the use of automated macro operations. As a result, ASM IBE139 is an ideal choice for high-efficiency mask and wafer manufacturers that demand precise and reliable inspection results.