Used ASM IBE 139 #293637814 for sale

ASM IBE 139 is a mask & wafer inspection equipment designed to offer superior performance, flexibility, and reliability. It has the capability to perform various types of inspection processes on various types of masks and wafers, including CD, CD Uniformity, Mura, and Defect Inspection. The system is built with a high-end optics unit which ensures a steady and consistent inspection process. It is integrated with a high resolution surface analyzer, enabling the machine to identify even small particles and impurities in the mask surface. It is complemented by an advanced image processing technology which helps to detect a range of defects including voids, patterns, and foreign materials on the mask. ASM IBE139 comes with a scanning head and stage, allowing for fast, accurate, and highly reliable scanning across the entire field of view. Its advanced software module enables the tool to analyze and identify defects with exceptional accuracy. It also supports a variety of measuring techniques and creates a detailed report of the measurement results. The asset also features a metrics analysis capability which allows for the rapid assessment of complex patterns and features on the mask surface. This feature is used to calculate the pixel count, brightness, contrast, and saturation of the image, providing an accurate overall view of the image on the mask. Furthermore, IBE 139 supports remote control, allowing for multiple operators to control the model from different locations. This feature saves time and increases productivity by permitting multiple operators to control the equipment simultaneously. In addition to these features, the system is also compatible with various AOI (Automatic Optical Inspection) systems. This helps to ensure the highest quality results and enable the easy integration of the unit into existing processes. All in all, IBE139 is a mask & wafer inspection machine that provides exceptional performance, flexibility, reliability and accuracy. Its scanning head and stage allows for speedy and accurate scanning; its advanced software module enables the tool to detect a variety of defects; and its remote control feature and AOI compatibility make it a great choice for any organization that requires robust mask and wafer inspection.