Used ASM IBE 139 #293637822 for sale

ASM IBE 139 is a mask & wafer inspection equipment designed to be used to detect defects and particles on semiconductor wafers. It has been developed by Automated Semiconductor Makers (ASM), a leading supplier of semiconductor test and inspection systems. The system is based on an Optical Microscopy Imaging Beam (OMiB) technique that combines high resolution imaging with automated particle removal. It has an integrated toolbox of over 50 automated tools that allow manufacturers and designers to analyze device defects quickly and accurately. The unit uses three main components. The first component is the microscope, an optical machine which produces close-up records of wafers. It can operate in various magnifications and resolutions to provide a detailed view of wafer's microstructure. It also includes advanced image processing software for automated image analysis, detect defects and particles, and to generate reports. The second component is the ultasonic cleaning. It is used to remove particles from a wafer by using ultrasonic waves. The waves are generated by a waveguide and then directed to a specific location on the wafer. The waveguide cleans the wafer surface and can also detect particles or cracks, which can be used for quality control. The third component is the infrared filter. It is used for removing particles from the wafer by removing the ultraviolet and visible light in the spectrum. It inspects a wafer with infrared radiation, allowing it to produce an enhanced image of particles and defects. By using these components, ASM IBE139 tool can be used to detect particles, defects and contamination on semiconductor wafers. It can also detect variability in the topography of wafers, deviations in filter specifications, and to monitor wafer surface quality. The asset can be used to maximize yield, reduce costs, and improve the quality of devices produced.