Used ASM IBE 139 #9253542 for sale

ASM IBE 139 is a leading-edge mask and wafer inspection equipment designed and manufactured by ASM International. This advanced imaging system has fast become the industry standard in imaging for semiconductor fabrication, offering improved inspection accuracy and reliability. ASM IBE139 unit combines a lightweight, compact design with sophisticated imaging and automated defect finding and classification software. At the heart of IBE 139 machine is a high-tech imaging device known as a Cross-section Scanning Electron Microscope (XSEM). This advanced microscope is capable of taking 3-D images of sample wafers and masks at a resolution of up to 50 nanometers. These images enable engineers to detect defects in the wafer or mask as small as a single atom in size. IBE139 is also equipped with a range of automated defect analysis tools that make inspection easier and more efficient. Its powerful defect-finding algorithms can detect and classify defects quickly and accurately, and a built-in web interface displays the results in real-time. This makes it possible to detect and fix defects while the lot is on-site, saving time and money. In addition to its imaging capabilities, ASM IBE 139 tool comes with a variety of advanced analysis and reporting tools that make it easy to track and review defect data. The asset produces detailed inspection reports, complete with diagrams and test results for easy reference. It also stores and tracks historical data, allowing engineers to compare and contrast results over time. ASM IBE139 is a reliable, high-quality imaging model that provides multiple benefits, including increased accuracy and efficiency, reduced cost, and improved defect detection capabilities. This makes it an ideal choice for any mask and wafer inspection tasks, from routine to high-volume applications. With its advanced imaging capabilities, it can quickly and reliably inspect defect-free parts and identify any potential issues with production.