Used ASM IBE 139CC #9118762 for sale

ASM IBE 139CC
ID: 9118762
Vintage: 2007
Input buffer systems 2007 vintage.
ASM IBE 139CC is a top-of-the-line automated wafer and mask inspection equipment designed to provide high-speed, high-precision results for advanced quality control applications. Utilizing a digital image-based inspection system, IBE 139CC is capable of inspecting both masks and wafers for defects, particles, scratches, and other irregularities in order to maintain the highest levels of product quality. The unit features a flat panel LCD display with built-in color calibration and a wide-field lens that allows the user to view multiple images simultaneously. This lens also allows multiple image captures at different focal lengths, with resolutions up to 4,000 × 4,000 pixels. ASM IBE 139CC also features a high-powered LED illuminator machine that can be adjusted to obtain the optimum lighting and background intensity for viewing images. It also has a built-in PC with advanced image processing and analysis capabilities. IBE 139CC is designed to provide reliable, high-speed defect detection performance. It performs automated inspections with variable speed up to 200 wafers/hour. In addition, its zero-latency static inspection tool is able to inspect large die sizes up to 200mm. Furthermore, ASM IBE 139CC incorporates features such as an advanced image sensor and image capture software asset that is capable of acquiring up to 12 standard datatypes and 12 die-level datatypes. It also provides both front- and/or back-side image inspection as well as patented die-level analysis and defect reporting. The combination of its intelligent defect detection and die-level analysis capabilities makes IBE 139CC an ideal choice for both wafer- and mask-level inspections. The model is also compatible with various advanced image processing technologies such as feature recognition, optical character recognition, and pattern recognition to provide the highest levels of accuracy for inspection results. Overall, ASM IBE 139CC is a high-performance mask and wafer inspection equipment that offers reliable, high-speed defect detection performance. With its flexible and user-friendly controls, advanced image sensor, and comprehensive image-based inspection capabilities, IBE 139CC is an excellent choice for a variety of quality control applications.
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