Used ASM LBE 139 #9299466 for sale

ASM LBE 139 is a high-performance mask and wafer inspection equipment. It has been designed to meet the demands of the semiconductor manufacturing industry, enabling mask and wafer inspection with the highest level of accuracy. LBE 139 features a large field-of-view scanning system, combined with 20X / 2.5X Magnification optics, that enables it to scan and inspect large wafers up to 6-inches in diameter. It offers the ability to switch automatically between red and green light illumination, allowing for optimized surface and subsurface inspections. The unit has two types of scan techniques - manual scanning and automatic scanning - that allow for fast and effective inspection. ASM LBE 139 has a high accuracy detection machine, which can detect blemishes, particles, and other defects on the wafer surface, with a resolution up to 0.5µm. It offers a wide range of inspection modes ranging from full mask, partial mask, single point, step and repeat, and more. The tool also has advanced editing functions like copy, delete, and move. LBE 139 also offers advanced image processing capabilities to quickly differentiate between good and bad features on the wafer. It has a high-end CCD camera, which is capable of capturing sharp images even under low-light conditions. In addition, the systems offers variable binning, automatic gain control, and programmable lens shift features for optimum image capturing. The asset comes with intuitive software, which provides a real-time display of the inspection results. It also provides an interactive user interface, with supports for multiple languages, which makes it user friendly and easy to use. ASM LBE 139 is a reliable and cost-effective solution for mask and wafer inspection. It is highly suitable for mass production applications, offering high accuracy and quick detection of surface and subsurface defects. The model is highly maintainable, and is backed by the manufacturer's technical assistance and spare parts support.