Used ASM SL2000 #9266383 for sale

ASM SL2000
Manufacturer
ASM
Model
SL2000
ID: 9266383
Vintage: 2006
3D Vision inspection system Tray to tray 2006 vintage.
ASM SL2000 Mask & Wafer Inspection Equipment is a highly advanced, state-of-the-art integrated optical inspection system. The unit features a modular platform design that allows for easy customization and scalability, as well as optional machine components for advanced mask and wafer inspection applications. SL2000's advanced optical metrology tool utilizes industry-leading imaging technologies, providing users with a robust toolset for quickly detecting and identifying print, lithography, and anti-contamination defects on substrate masks and wafers. This advanced asset also employs a powerful, high dynamic range imaging process which adjusts the model to the needs of each substrate type, while maintaining the highest level of accuracy possible. The equipment offers a range of capabilities for visual inspection, image analysis, defect classification, and screening for various types of defects. It can detect and define defects down to 5ix, and is equipped with real-time, cable-free data transfer capabilities for on-device defect analysis. In addition, the system has a built-in, industry-standard job history management toolset, allowing users to quickly recall previous inspected patterns and secure data. The SL 2000 also features an intuitive, user-friendly graphical user interface that allows operators to quickly define job parameters and quickly set up the unit for various inspection tasks. The machine supports both manual and automated operation and can be fully configured for a variety of inspection scenarios. Furthermore, the SL 2000 has a built-in remote control tool, enabling users to access the asset for data review and image adjustment from any remote location. ASM SL 2000 Mask & Wafer Inspection Model is the perfect choice for customers who require robust and cost-effective mask and wafer inspection solutions. This advanced equipment can improve efficiency, reduce waste, and ensure maximum quality and accuracy of inspected substrates.
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