Used ASM SOL 139 #9217617 for sale

ASM SOL 139
Manufacturer
ASM
Model
SOL 139
ID: 9217617
Vintage: 2005
System 2005 vintage.
ASM SOL 139 is an advanced mask and wafer inspection equipment used in the semiconductor industry. It is designed for use in production lines, research and development labs, and universities. The system provides a combination of 4K Digital Brightfield, North Brightfield, and Darkfield imaging which makes it ideal for examining specimen surfaces for defects such as pits, scratches, and particulates. SOL 139 unit utilizes sophisticated optics and imaging techniques in order to produce high resolution images of microcircuit features. It can detect even the smallest defects on the specimen surface. Its advanced algorithms allow for automated defect detection, classification, classification and sorting. The machine also offers manual input of defects for tasks such as inspecting solder joints or measuring critical dimensions of a pattern. The tool is built on a modular and open architecture, providing flexibility and upgradability for future tasks. It can be easily integrated into existing production lines and can be customized for specific applications. Thanks to its modularity, users can design their own configurations for each application or use existing configurations. The central element in the asset is the LED-lit 2.4 MP HD camera and the powerful image processor. The model additionally features a precision XZ stage of 500x500 mm. This XZ stage is equipped with a joystick control, giving the user an easy way to manipulate the specimen and focusing on the desired area. With the joystick, users can also adjust the focus manually. In addition, ASM SOL 139 equipment features a 192 step motor belt and drive motor for automatic mask and wafer loading and unloading. The system also includes a touch screen, allowing for intuitive control of the on board display. A high capacity hard disk drive is also included for storing the image data. Overall, SOL 139 is an advanced mask and wafer inspection unit that offers high resolution imaging, automated defect detection and classification, and intuitive control. With its modular design, it is easily integrated to existing production lines and provides flexibility for future applications. It is an ideal machine for inspecting semiconductor specimens in production, research, and development labs.
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