Used ASM TIB 139 #293656557 for sale

ASM TIB 139 is an advanced non-destructive inspection equipment for mask and wafer defects. It is the ideal high-performance automated solution for quality control, process optimization, and fabrication yield improvement. The system is capable of analyzing a wide range of defects such as cosmetic flaws, scuffs, warpage, contamination, variations in thickness, particles, and other non-conforming features. The major components of the unit include the semiconductor inspection platform, a wafer chuck and adjustment module, a vision machine, an alignment unit, and a controller. The platform contains an adjustable stage and wafer transport tool, and is constructed using rigid material and shock absorbers, to ensure accurate wafer placement and support. The wafer chuck and adjustment module is used to fine tune the wafer's positioning for optimum inspection, while the vision asset is used to capture the defects and to precisely analyze them. The alignment unit helps the camera to acquire exact images, allowing for the highest resolution images possible. Lastly, the controller unit ensures that the model parameters are reliably monitored and adjusted in order to optimize equipment performance. The system provides high-precision, high-speed, and non-intrusive imaging, allowing it to inspect up to 300 wafers per hour with an accuracy of up to 0.2 microns. The imaging unit lets technicians analyze the defect images and make appropriate adjustments quickly and precisely. The machine also uses a techno-layer technique to distinguish between materials, allowing users to analyze wafer layers in addition to individual devices. The tool is also designed with a secure and flexible graphical user interface. This interface allows users to customize asset settings and calibrate the model to their desired requirements. This ensures that each equipment is tailored specifically to the task at hand. Overall, TIB 139 Mask & Wafer Inspection System is an easily configurable and reliable inspection solution. It is an ideal choice for semiconductor production, allowing users to achieve high accuracy and reliable inspection results. The unit has earned a reputation for being an advanced and highly reliable defect detection machine and has been successfully implemented in many large industrial production sites.