Used ASM TIB 139 #9299463 for sale

ASM TIB 139 is an automated mask and wafer inspection equipment designed by ASM Technology. This system allows for the fast and accurate inspection of masks and wafers during the semiconductor manufacturing process. TIB 139 unit consists of an automated inspection station and related monitor-based software. The automated inspection station utilizes a proven in-line machine for measuring critical dimensions on a mask or wafer, along with a multi-axis motion tool for precise and rapid imaging. The monitor-based software is used to acquire, manipulate, analyze, and store the acquired images. ASM TIB 139 asset is capable of detecting a wide range of defects on masks and wafers. It compares images to a pre-defined mask or wafer design, and is capable of flagging any defects that may be present, such as missing elements, shape, pattern, and overlay registration variations. The model can also detect contamination including particles, voids, pin-holes, and grains. TIB 139 equipment is capable of imaging a wide variety of materials, including aluminum oxide, silicon, stainless steel, and quartz. It can also inspect and image multiple levels of the surface of a single mask or wafer with sub-micron accuracy. In addition, the system features a high-grade vacuum unit, which allows it to maintain a controlled environment for the handling and imaging of sensitive materials. The machine also utilizes multiple detector probe microscopes, which are used to precisely measure various characteristics such as critical dimensions and overlay accuracy. Overall, ASM TIB 139 tool is an versatile and reliable tool for mask and wafer inspection. It is capable of accurately detecting defects on a wide range of materials, and its high-grade vacuum asset and multiple detector probe microscopes ensure that it can deliver reliable results in a controlled environment.