Used ASM TIB 139 #9299470 for sale

ASM TIB 139 is an automated mask and wafer inspection equipment designed to quickly identify and detect defects on mask and wafer surfaces. The system performs a variety of inspections, including visual, automated optical, and/or electron beam. TIB 139 is a fully-enclosed unit, designed to provide high throughput and automated defect detection capabilities with maximum levels of accuracy and precision. The machine comes with two distinct inspection modes that can be used to inspect masks and wafers with different shapes, geometry, and angles. The first mode inspects using automated optical inspection, which uses high-resolution camera technology to detect gross defects on mask and wafer surfaces. The tool is programmed with advanced software algorithms that allow for more precise and accurate defect detection. It is also equipped with a well-defined light source to ensure accurate results. The second mode is electron beam inspection, which uses an electron microscope to precisely examine the surface of the wafer or mask substrate. This mode provides extremely detailed images that allow the user to detect very small defects that may not be visible with automated optical inspection. ASM TIB 139 asset is a easy to use, extremely accurate and precise tool that has been designed to meet the needs of any high-volume semiconductor manufacturer. It offers a wide range of inspection capabilities while providing the highest level of accuracy and reliability. Whether it is used to inspect masks or wafers, the model offers unbeatable accuracy, precision and ease of use.