Used ASM TIB 139 #9299596 for sale

ASM TIB 139 is a mask and wafer inspection equipment designed for the semi-automatic inspection of semiconductor masks and wafers. The system combines a 5-megapixel, CCD digital camera and a nanometer-sized 3D imaging objective with an automated stage unit and a mask and wafer illumination machine. This allows the tool to detect surface defects, particles, and scratches on the mask or wafer during production. The asset also has the ability to merchandise and calibrate the camera and illumination model to obtain a precise image. TIB 139 can be used for a variety of functions, including contact and non-contact inspection, alignment of mask to wafer coordinates, and die-mapping of wafer-IDs and serial numbers. The equipment is designed to automate inspection operations, increasing productivity by reducing the amount of manual labor required. Additionally, the system can be programmed to automatically recognize and reject defective masks and wafers. ASM TIB 139 can be used to inspect a variety of semiconductor processes, including Deep UV (DUV) lithography, photoresist, and other coating processes. The unit can be calibrated for different wafer and mask formats, and allows for automatic calibration of different exposure doses and depths of focus. Additionally, the machine can be used to scout for visual defects during production, as well as to check for contamination caused by sub-visible particles. TIB 139 is designed for easy operation and maintenance. The tool is equipped with a large touch-screen monitor, which allows users to quickly and easily navigate and control the asset. Additionally, the model includes both manual and automatic modes of operation, as well as a comprehensive data logging equipment which allows users to record and track inspection data. ASM TIB 139 is a convenient and intuitive way to inspect semiconductor masks and wafers. The system is designed to increase production volume and efficiency, while reducing the amount of manual labor required. Its automated inspection capabilities allow users to quickly and accurately detect surface defects, particles, and scratches, helping to ensure the quality of their products.