Used ASYS INSIGNUM 3000-D #9248476 for sale

ASYS INSIGNUM 3000-D is a 'mask & wafer inspection' equipment that provides automated and fast wafer surface inspection of mask or wafers. The system uses high-resolution digital imaging technology with advanced image and detection algorithms to provide complete and precise evaluation of any defects. The integrated light source of the unit is a 240mm mini-ring array that provides uniform coverage of the entire wafer. The imaging component of the machine is a high-resolution, high-frame-rate, 16-bit color camera that can provide images of any defects on the surface of a wafer. The tool also offers a variety of processing functions, including image registration, defect identification, misalignment detection, noise removal, etc. INSIGNUM 3000-D includes an onboard computer that provides the most important functions for fast and reliable object inspection. It uses Multi-Core Processing Technology to maximize speed and throughput, which allows the asset to rapidly acquire, analyze and report results with maximum accuracy. The model is capable of detecting a wide range of defects, including particles, scratches, pits, chips, edges, and imperfections. It can also detect situations like inverted/ misaligned mask elements and bonded/ unsealed/ buried elements. ASYS INSIGNUM 3000-D provides accurate inspection results in comprehensible graphs and combined images. The equipment is equipped with automatic / manual modes allowing the user to optimize the inspection process. The system offers user-friendly touch-screen control operated by the rapid response ASYS User Interface. The advanced software of INSIGNUM 3000-D includes a variety of features, like statistical analysis, mask inspection library, defect database, and support for TIFF, BMP, JPG, and RAW image types. Overall, ASYS INSIGNUM 3000-D provides an efficient and reliable mask & wafer inspection unit that incorporates advanced imaging technology and powerful software features for fast and accurate inspection of any defects on the surface of a wafer or mask element.