Used BIO-RAD Quaestor Q7 #9240605 for sale

BIO-RAD Quaestor Q7 is a mask and wafer inspection equipment designed to meet the needs of semiconductor manufacturers and research laboratories for high-resolution image analysis and defect characterization. The system offers high-speed imaging and image analysis of large areas of the wafer with flexible optics, allowing detailed analysis and characterization of small topographical features like photolithography patterns, overhangs, and surface details. Its mechanical stage and scanning stage provide precise wafer positioning and provide accurate alignment for large-area imaging. BIO-RAD QUAESTOR Q 7 inspection unit is capable of detecting multiple types of defects such electrodes, pads, linewidth, and other features. It has three light sources for imaging applications such as wafer surface measurements, image acquisition and image analysis, and inspection. The machine is equipped with a high-resolution 5.5mp CMOS detector and ultra-fast image acquisition and processing speed. The Q7 tool features powerful image analysis and data mining software to identify patterns and defects quickly and accurately. Automated tooling support enables the user to identify, isolate, and characterize image patterns and defects. Furthermore, advanced surface analysis tools significantly reduce the time needed to analyze data from analysis of precise line parameters measurement, measuring of defects and profiles, and data mining. The asset is easy to use and offers an intuitive graphical user interface with a variety of applications such as defect detection, pattern recognition, and defect characterization. A comprehensive library of common-surface parameters simplifies image analysis. Additionally, a barcode scanner enables quick association with wafer details such as batch ID and lot size. All in all, Quaestor Q7 mask and wafer inspection model is a comprehensive tool for semiconductor inspection. It offers high-speed imaging and image analysis, allowing precise characterization of small topographical features. The equipment's powerful data mining and image analysis software ensure quick and accurate detection and characterization of defects. It features intuitive user interfaces and flexible optics, further improving the performance of the system.