Used BROWN & SHARPE MicroVal 343 #165203 for sale

BROWN & SHARPE MicroVal 343 is a high-precision, automated mask and wafer inspection equipment designed to provide detailed and accurate analysis of semiconductor device structures. MicroVal 343 is capable of accurately analyzing fine pitch wire bonds, etched lines, metal lines, contact pads and other structures, including inspecting particles or defects down to 0.5µm. The system is equipped with an enhanced optical module featuring state of the art optics and illumination techniques which allows operators to acquire high resolution images of any size sample, including wafers up to 10 mm in thickness. This module is also equipped with brightfield, darkfield and polarized imaging for discerning features on wide variety of materials. It also offers a variety of automated routines for aligning and positioning samples quickly and accurately. BROWN & SHARPE MicroVal 343 is highly efficient and incorporates an array of features which minimize the time required to acquire accurate measurements and data. It features real-time error checking for critical measurements and also has a robust toolset for diagnosing and managing process variations. In addition to the inspection and scanning capabilities, the unit also offers a range of data analysis tools, including OCR (Optical Character Recognition) and statistical analysis algorithms. This enables the user to precisely analyze large scale device structures or assets, and quickly identify any discrepancies or errors. The software and hardware of MicroVal 343 is fully integrated, allowing the machine to be customized to easily meet specific user requirements. For example, the tool can be set to perform automated measurements or analysis on a set of samples, or allow users to manually set parameters for a specific application. This flexibility and customization makes BROWN & SHARPE MicroVal 343 a highly capable and efficient tool for mask and wafer inspection.