Used BROWN & SHARPE MicroVal 343 #9022258 for sale
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ID: 9022258
Coordinate measuring machine (CMM)
Electronic touch probe system
Measuring range:
X-axis: 14"
Y-axis: 16"
Z-axis: 12"
Work table area: 17" x 27"
Work height capacity: 15"
Air supply required: Operating pressure: 60 psi
Electrical: 1/60/115 VAC
Repeatability: 0.00016"
Volumetric accuracy: 0.0006"
Renishaw TP1s Touch probe system
Computer with widescreen flat panel monitor
CMM Manager: 3.3 CAD Software.
BROWN & SHARPE MicroVal 343 is a highly advanced mask & wafer inspection equipment. It is designed for the quality assurance and precision inspection of semiconductor wafers, masks and related components. The system uses a state-of-the-art CCD-based digital video camera and an advanced image analysis unit to accurately pinpoint discrepancies and imperfections in wafer surfaces, mask defects and other process-critical features. MicroVal 343 is capable of magnifications of up to 300x, letting users detect even the smallest of anomalies. BROWN & SHARPE MicroVal 343 is designed for easy operation and flexibility. A user-friendly touch screen interface with contextual menus simplifies the setup and inspection process. The machine can be configured for either automated or manual operation. In manual mode, a cross-hair cursor helps to pinpoint exact positions on the wafer for inspection. MicroVal 343 also features host of programmable parameters such as display magnification and contrast, measuring capabilities, color filtering modes, image enhancement algorithms and a library of predefined defect criteria. Furthermore, the tool comes with several sophisticated software tools to aid quality assurance and reporting processes, such as yield analysis, plotting, marking and archiving. BROWN & SHARPE MicroVal 343's software is both Windows and Linux compatible. Additionally, a number of specialty accessories, such as automatic mask inspection stages, are available. All of this makes the asset ideal for use in semiconductor processing, chip manufacturing and other critical applications. Overall, MicroVal 343 is a highly sophisticated, yet user-friendly inspection model capable of precisely detecting even the smallest of anomalies in semiconductor wafers, masks and related components. Its capability and flexibility make it an ideal tool for quality assurance and precision inspection.
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