Used BROWN & SHARPE MicroXcel 765 #9029127 for sale

BROWN & SHARPE MicroXcel 765 is a sophisticated mask and wafer inspection equipment specifically designed to quickly and accurately inspect photomasks and wafers for defects. It provides a high resolution, high contrast inspection of masks and wafers with up to 1000 X magnification. The unit is designed for a wide variety of inspection tasks, from process control to defect analysis. The display of the system is an integrated 15.1-inch LCD touch screen with an intuitive user interface. The screen is divided into four inspection windows where the user can view the masks and wafers from up to four different angles. The graphical user interface allows users to quickly and easily adjust the on-screen parameters such as pixel size, area of magnification, image size, and magnification. In addition, the high-resolution images allow for easy identification and detailed inspection of the smallest defects. The unit also features light source control which allows it to adjust the brightness and color of the inspection windows for optimal viewing of the masks and wafers. The machine is equipped with auto-focus control for improved imaging of defects and has automated threshold setting to ensure accurate inspection of the masks and wafers. The tool is designed to run under controlled temperatures and humidity levels. This helps reduce the risk of dust contamination as well as damage to the inspection windows during the inspection process. The asset is also compatible with a variety of leading industry imaging and analysis software such as Metius, Digital PhotoWorks, and Image Analysis, which allows the user to easily integrate raw image data into their existing analysis and inspection processes. MicroXcel 765 is an advanced inspection tool for mask and wafer detection and defect analysis. It is equipped with a user-friendly interface, high resolution imaging, and automated processes for consistent and reliable inspections. The device is designed to run in extreme temperatures and humidity levels and is compatible with a range of leading industry imaging and analysis software, making it an ideal model for process control and defect analysis in the semiconductor industry.