Used BROWN & SHARPE MicroXcel PFX 454 #9390272 for sale
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ID: 9390272
Measurement system
Sharpe controller
5P System
PH9 Reni Shaw probe head.
BROWN & SHARPE MicroXcel PFX 454 is a state-of-the-art mask and wafer inspection equipment. This system provides optimal inspection for mask and wafer defects at critical levels of feature sizes. It features a 3-inch Reticle/Mask Inspection Unit (RIS) with a field of view of up to 10 mm and a 5-inch wafer inspection machine (WIS) with a field of view of up to 75 mm. Furthermore, this tool utilizes built-in pattern recognition, patented thermoluminescence, and defect classification algorithms to give highly accurate detection and classification results. Additionally, the asset can be configured with both wet and dry harsh inspection capabilities. MicroXcel PFX 454 offers technicians and operators the ability to capture extremely clear images of entire masks, lens-to-lens, and individual die. The model also provides an automated re-inspection of previously inspected wafers and masks to ensure correctness. Additionally, it is capable of inspecting up to 150 wafers per hour and can re-inspect up to 30 defects found at a time. This provides an efficient and accurate way to test and inspect masks and wafers in a production environment. BROWN & SHARPE MicroXcel PFX 454 is an effective tool for managing and performing inspection mask and wafer inspection. It supports High NA (numerical aperture) and low light levels, offers optimal resolution and contrast, and is easily calibrated for different types of products. The equipment provides superior accuracy and is capable of detecting defects in feature sizes down to 18 nanometers. The versatility of the system makes it an ideal choice for both high-volume and low-volume production environments.
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