Used BROWN & SHARPE One 775 #9116091 for sale

BROWN & SHARPE One 775 is a mask & wafer inspection equipment designed to exceed the demanding requirements of the semiconductor industry. This automated optical inspection system provides users with high sensitivity and fast, accurate measurement of mask & wafer features with astute precision and repeatability. The core of One 775 is its advanced design. It is comprised of a high-precision x-y-z robotic stage; a scanning head with 256-pixel-powerful-RGB-illuminator, a wafer & mask distance sensor, and a powerful built-in vision processor. These components come together to provide all necessary functions of inspection. The x-y-z robotic stage is responsible for the precise and accurate positioning of a mask during the exposure and scanning process. The stage then precisely controls the motion of the scanning head across the mask or wafer under test. This stage is constructed using a high-accuracy, low-friction linear bearing mechanism for optimum performance. The scanning head features a powerful-RGB-illuminator with 256-pixels and multi-beam setting. This unit allows for a wide range of mask and wafer inspection conditions. The built-in wafer & mask distance sensor precisely measures the actual distance between the mask and wafer. The powerful motor-based optics inside the scanning head can create a unique exposure sequence for various mask & wafer patterns. In addition, BROWN & SHARPE One 775 possesses a robust built-in vision processor. This processor intelligently processes the acquired scan data to quickly determine any defects and then process advanced algorithms to choose the best solutions and present the final outcome. This innovative machine also comes with a user-friendly graphical interface and supports multiple languages for a truly globalized product. One 775 is ideal for all mask & wafer inspection functions. Its accuracy and precision as well as its built-in vision processor make it an excellent choice for precise, repeatable, and high-quality mask & wafer inspection.