Used BROWN & SHARPE Profile 80 #9171699 for sale

ID: 9171699
Profile measurement shaft checker Pro-measure V 1.63 Operational requirements: Storage temperature range: Metric: -30 to 60° C Imperial: -22 to 140° F Storage humidity: Metric: 75%rh max Imperial: 75%rh max Operating temperature range: Metric: 10 to 35° C Imperial:50 to 95° F Operating humidity: Metric: 10 to 80%rh Imperial: 10 to 80%rh Power requirement: Metric: 100 / 110 / 220 / 240V 50/60 Hz Power consumption: Metric: 450 W max P80 Air pressure: Metric: 3 Bar Imperial: 45 PSI P80LS Air pressure: Metric: 4 Bar Imperial: 59 PSI.
BROWN & SHARPE Profile 80 is a wafer and mask inspection equipment specifically designed for the semiconductor production industry. It is designed to review a high volume of parts in a short period of time, ensuring quality assurance and accurate inspection results. The system can be customised with a range of sensor heads, including wafer, mask, reticle and substrate inspection, allowing imaging and comparison of patterns and features. A multi-camera head and contrast vision unit are included as standard, providing powerful features for image analysis. Profile 80 offers an intuitive operating machine with a full colour touch screen interface. It can be used to measure the shape of a pattern or size of a feature, providing unprecedented accuracy. The tool can also detect defects, differences, anomalies and any changes in co-planar levels. One of the main benefits of BROWN & SHARPE Profile 80 is its ability to detect fine line defects in both mask and wafer patterns. It features an advanced edge detection capability, aiding in the detection of very small feature defects, which are often missed by conventional metrology tools. In addition, the asset is easy to set up, allowing for rapid inspection times with minimal setup complexity. Profile 80 is equipped with a range of additional features to ensure optimal performance, such as integrated motion control, rigid body motion compensation and real-time defect sorting capabilities. It also supports automated wafer tracking, rapid wafer transfer mode and data logging for further analysis. Overall, BROWN & SHARPE Profile 80 is an advanced inspection model that is ideal for wafer and mask inspection in the semiconductor production sector. It offers a wide range of powerful and reliable features making it an excellent choice for efficient and accurate inspection.
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