Used BROWN & SHARPE Xcel 765 #154417 for sale

BROWN & SHARPE Xcel 765 is a mask and wafer inspection equipment designed to automate the testing and inspection of photomasks, semiconductor wafers, and other flat panel displays. It has an intuitive touchscreen user interface for quick setup and controls that allow for flexibility in various test settings. The system is primarily used for defect analysis, 3D measurements, as well as inspections for microsopic defects and discrepancies on masks and wafers. Xcel 765 has a modular design, so users can select from a variety of options to customize the unit to their individual requirements. Options include a variety of camera types such as CCD, CMOS, and NIR, along with a range of illumination techniques. The optical table size can also be configured accordingly, while the motorized control provides smooth operation with high repeatability. BROWN & SHARPE Xcel 765 also features several patented technologies, such as its PPI (Patterned Particle Inspection) technology which enables automatic detection of particles on photomasks and wafers. This machine can detect particles down to 50nm, with quick results and high accuracy. Another feature is AVP (Automatic Vision Patterning), which can align, tilt, and rotate parts with precision and speed. Xcel 765's closed-loop DEFACT control enables automated scanning, testing and adjustment of defect-type masks. This provides a continuous analysis and reporting of microscopic defects, minimizing the need for manual inspection. Additionally, the machine can be configured for automated bar code scan and 3D measurements, improving productivity and accuracy. Overall, BROWN & SHARPE Xcel 765 is a highly efficient tool for mask and wafer inspection. With its intuitive user interface, various customization options, and patented inspection technologies, it is an ideal choice for any industry requiring quick and accurate inspection of masks and wafers.