Used BROWN & SHARPE Xcel 9-15-9 #9177715 for sale
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ID: 9177715
Vintage: 2000
DCC Coordinate measuring machine
Measuring range:
X-Axis: 35.4”
Y-Axis: 59.1”
Z-Axis: 35.4”
Distance between posts: 43”
Distance under rail: 35”
Black granite table: 51” x 86.5” x 8”
Software: PC-DMIS
Joy stick controls
Renishaw PH-10MQ probe
Renishaw SCR-200 6-Position stylus changing rack
Renishaw maps 6-Position probe stand
2000 vintage.
TheBROWN & SHARPE BROWN & SHARPE Xcel 9-15-9 is a state-of-the-art mask & wafer inspection equipment for making sure uniformity and accuracy to the highest standards. Its 15-inch laser projection system is designed to refine the inspection process with unrivaled accuracy, traceability and repeatability of defect characteristics. The unit provides unmatched image clarity and measurement accuracy, with 99.9% repeatability, plus 1 micron resolution. Projects calculations of oval, round and sharp corners, plus line and edge measurements, so that operator variables are eliminated. The machine includes two class-leading automated optical comparison tools: the Xcel Wafer Mapping Tool and the Xcel Wafer Mask Inspector. The Wafer Mapping Tool is capable of measuring both full-masked and no-masked wafers. Using advanced "beam position sensing" compared to traditional "pattern recognition" technology, it ensures the most accurate analysis and comparison of wafer features. The Wafer Mask Inspector evaluates patterns of opaque and transparent material while providing extremely accurate information about the patterns of both mask and wafer in order to detect defects. It also features a high performance imaging tool with proprietary Optical Character Recognition technology for rapid digitization and comparison of mask pattern plans. Xcel 9-15-9 asset integrates withSEMI M1-1010: Mask-Wafer Overlay Standard measuring program for inspection of differences between design and fabrication in both wafers and masks. In addition, the model offers several software packages for enhanced management and analysis of mask and wafer data. TheXcel Mask Design Interfaceallows users to upload a design file and then create a mask plan, which can be verified against an existing mask and visualized in 3D before fabrication. TheXcel Feature Extraction Toolenables automated detection of features, geometries and dimensions, as well as mask and wafer mapping to identify patterns and relative distance. It allows users to compare multiple wafers simultaneously in order to measure characteristics with greater accuracy. TheBROWN & SHARPE BROWN & SHARPE Xcel 9-15-9 is an invaluable tool for every semiconductor fab company and offers unprecedented precision when inspecting mask & wafer features. Its combination of automated optical comparison tools, high performance imaging equipment, and software packages provide industry-leading accuracy for trouble-free production.
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