Used CARL ZEISS / HSEB Axiospect 300 #9397356 for sale

CARL ZEISS / HSEB Axiospect 300 mask & wafer inspection equipment is a versatile and highly precise automated inspection system for the inspection and analysis of semiconductor wafers, masks and photomasks. This unit offers three-dimensional optical measurements of features such as surfaces, defects, and overlay across the complete surface area. HSEB Axiospect 300 combines both a high numerical aperture (NA) and the highest possible depth of field to provide extremely fine focus and resolution, achieving sub-micron resolution capable of performing both automated full-surface inspection and detailed feature identification. CARL ZEISS Axiospect 300 incorporates a variety of lighting modes to address a vast range of inspections, allowing the machine to effectively handle reflective samples as well as imaging specimens with high surface-topography variation. Axiospect 300 allows defect classification to exacting standards, providing a clear picture of the state of any sample and identifying localized defects, as well as large-scale contamination. This is further enhanced by onboard image acquisition with near-endless types of image scenes, from maximum color presentation to die-level inspection of features like electrical test marks. CARL ZEISS / HSEB Axiospect 300 is capable of a large range of inspection modes, from simple area checks for large-scale contamination, for example, to in-depth optical inspections down to nanometer resolutions. It is easily customizable to ensure a greater accuracy tailored to any customer's sample and needs. Reports and data can be easily uploaded to a network for remote storage, as well as direct comparison of inspection images for quick identification of any error or defect. It also includes a wide array of accessories such as decapsulating solutions and specialized wafer skids, allowing HSEB Axiospect 300 to be used in a variety of industries. CARL ZEISS Axiospect 300 is reliable and easy to use, making it an invaluable tool for mask and wafer inspections.