Used CARL ZEISS MeRit HR32 Plus #9254285 for sale

CARL ZEISS MeRit HR32 Plus is a mask and wafer inspection equipment that uses innovative technology for crystal-clear defect characterization. This system works by tracking small, yet important, features on masks and wafers in order to detect any defects. MeRit HR32 Plus harnesses multiple individual light sources that project a different pattern of structured light. This unit is designed to be compact, taking up minimal amount of space, yet still offering powerful and reliable performance. Each light source creates two perpendicular, linear curves as the light strikes the mask/wafer. Any defects still visible after the light passes through are illuminated by a light source image to be analyzed in real-time. To ensure accuracy of results, the inspection process utilizes Autofocus Depth Control and a 3D metrology machine. These features combine to enable the user to automatically control focus and measure the 3D surface profile of the masks/wafers. This removes the need to manually adjust the imaging optics. The software provided with this tool is easy-to-use and includes several features that help streamline the inspection process. These include: an integrated report generator, a comprehensive defect database, and an intuitive Graphical User Interface (GUI). With these features, the user can quickly diagnose any defects and access all the data collected during the inspection. CARL ZEISS MeRit HR32 Plus is ideal for metrology applications in the field of photolithography. It is the perfect choice for high-resolution inspection, 3D defect imaging, and high-precision mask alignment and measurement. This asset is able to quickly detect non-uniformities and defects that can not be seen with the naked eye. With its impressive accuracy and reliable performance, MeRit HR32 Plus is an ideal companion for every metrology application.