Used CEI 651 #9271495 for sale

CEI 651 is a high-performance automated mask and wafer inspection equipment designed to provide reliable and repeatable quality assurance and process control. This system integrates the latest in computer vision hardware and software into an intuitive and easy to use platform. 651 utilizes advanced illumination technology for precise and repeatable imaging. Through the use of dynamic lighting, projection, and imaging technology, this unit is capable of detecting minor surface anomalies, resulting in accurate defect characterization. CEI 651 also features a powerful camera machine that captures high quality, high-resolution images while minimizing noise. This allows for improved surface quality inspection and more accurate defect detection. To ensure accuracy, 651 offers several advanced image processing techniques, including edge detection, filtering, and pattern recognition. All these features enable the tool to quickly and accurately identify defects in complex mask and wafer surfaces. The asset also features advanced data analysis algorithms to facilitate improved operator understanding of the analysis results. In addition, CEI 651 also offers advanced defect analysis tools such as the Optical Image Analyzer (OIA). This OIA enables users to quickly and easily compare a reference image with a specimen image, allowing for a more detailed assessment of any discrepancies. This can be used with the OIA to check for pinhole defects, as well as other minor surface features. 651 provides a reliable and repeatable source of quality assurance and process control that is essential for the production of high-quality masks and wafers. Its advanced illumination, camera and image processing technologies, as well as its advanced defect analysis tools, enable users to accurately identify and characterize defects on complex surfaces. With its fast and intuitive interface, CEI 651 is a user-friendly and reliable means of achieving improved quality control and cost efficiency.