Used CHAUVIN ARNOUX CA 6425 #9352728 for sale

CHAUVIN ARNOUX CA 6425 Mask & Wafer Inspection Equipment is a semiconductor test and measurement system designed for the inspection of advanced wafers and mask lithography. It is provided with a built in optical station which provides high resolution digital imaging for the detection of defects. This unit features an intuitive user-interface, automated functions and measurement capabilities that can be customised for specific applications. The inspection machine comes with CHAUVIN-ARNOUX CA 6420/6421 Digital Video Tools software, an integrated development tool which provides an intuitive and powerful graphical user interface to control the operation. This software enables the user to measure, analyze and report on the imaged wafers and masks by performing operations such as contrast, brightness and binary operations. The CA 6420/6421 Video Tools software also enables advanced functions such as edge mask and hole mask recognition and cross marking. Other features of CA 6425 Mask & Wafer Inspection include variable field-of-view for high and low resolution imaging, multiple illumination options for different types of masks and wafers, image capture and comparison capabilities, as well as extended capabilities for Automatic Defect Classification and Reporting (ADCR). CHAUVIN ARNOUX CA 6425 Mask & Wafer Inspection tool can be integrated with a number of different external inspection equipment and accessories such as a motorized Z-movement stage, motorized and manual X-Y stages, digital camera, 2D BGA pick-and-place and wafer-level measurement systems. To ensure accuracy, all external devices are carefully calibrated by the CHAUVIN-ARNOUX software according to the specific application. Additionally, CA 6425 Mask & Wafer Inspection asset can also be integrated with an analysis module, allowing for both defect evaluation and defect classification and reporting. The analysis module provides automated measurement and reporting capabilities for various test features such as line and edge width, circle and ellipse size, as well as registration accuracy. Overall, CHAUVIN ARNOUX CA 6425 Mask & Wafer Inspection model is an intuitive and powerful equipment that provides high resolution imaging, automated and customised measurement capabilities, and integrated defect analysis. It has been designed to meet the high-speed wafer and device mask production requirements of today's semiconductor manufacturing industry.