Used CORNING / TROPEL Flatmaster 200 #9234037 for sale

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ID: 9234037
Wafer metrology system Part number: 128892-4280 Grazing incidence interferometer, 8" Wafer chuck, 4" Base support assembly High speed workstation Operating system: Windows XP Hard drive back-up system LCD Monitor, 17" Ethernet LAN Interface Manual included.
CORNING / TROPEL Flatmaster 200 is an advanced mask and wafer inspection equipment. It is specifically designed to accurately inspect flat surfaces of masks and wafers by utilizing light scattering and reflection techniques. TROPEL Flatmaster 200 has two kinds of inspection modes, which are designed to give precise and reliable readings of both the mask and the wafer. The first inspection mode is the 'Feather Edge' mode, which uses light reflection to detect any defects along the edge of the mask or wafer. The light beam is scanned along the edges of the surface, and any irregularities such as particles or cracks will be detected. The Feather Edge mode is especially useful in inspecting improved wafers, as it can identify incredibly small imperfections. The second inspection mode is the 'Flatmaster' mode, which uses light scattering to accurately inspect the whole surface of the mask or wafer. This mode is particularly useful in detecting any irregularities such as chips, bubbles, streaks, grains, or voids. The Flatmaster mode is able to detect even the smallest of defects, giving users precise readings of the mask or wafer. CORNING Flatmaster 200 is also equipped with a powerful image processing feature that greatly enhances the accuracy of the inspection system. It can automatically compensate for environmental noise and interference, giving a clearer and more accurate image. Finally, Flatmaster 200 also has a variety of output formats, which makes it compatible with most existing inspection systems. This allows users to easily integrate the Flatmaster into their current setup, and they can also easily view and analyze the data gathered by the unit. Overall, CORNING / TROPEL Flatmaster 200 is an advanced inspection machine that is designed to provide precise and accurate readings of flat surfaces of masks and wafers. Its light scattering and reflection techniques, as well as its powerful image processing capabilities, make it ideal for detecting even the smallest of imperfections. Furthermore, its compatibility with other existing inspection systems makes it easy to integrate the tool into any existing setup.
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