Used CORNING / TROPEL UltraSort #293585680 for sale

CORNING / TROPEL UltraSort
ID: 293585680
Wafer Size: 2"-6"
Vintage: 2010
System, 2"-6" 2010 vintage.
CORNING / TROPEL UltraSort is a comprehensive mask and wafer inspection equipment designed to help improve yield in semiconductor manufacturing processes. It offers a range of features and capabilities to enable rapid in-line or off-line defect detection in semiconductor wafers and masks. The system is capable of detecting both surface-level defects and depth-level defects, with advanced algorithms developed to recognize both physical flaws, such as pitting, particles and erosion, as well as systematic flaws, including circuit-level shorts and opens. Furthermore, TROPEL UltraSort unit works in tandem with an advanced automated optical inspection platform, providing speedy detection and tracking of defects. These features enable users to improve yield and reduce down-time. The ultra-high-resolution imaging capability of this machine ensures that even the smallest defects can be detected. In addition to high resolution, it also offers polarized imaging which can detect contamination and other particle issues in various stages of production. The tool also features a device-level shrink feature, permitting focus modification during operation, to reduce the effect of shadowing and provide optimal focus for optimal resolution. A powerful user friendly interface enables operators to control the asset easily and efficiently, with parameters such as wavelength, sample area, scan strategies, etc. adjustable on the fly. The model also includes several remote analysis options, allowing engineers and technicians to perform detailed analysis externally, while the equipment is operated in-line. Quality data can also be shared across multiple systems over the network or Internet. Overall, CORNING UltraSort is an advanced, user-friendly mask & wafer inspection system that offers high-speed defect detection and tracking across a wide range of semiconductor production processes. With its advanced features, the unit is capable of detecting a wide variety of surface-level, depth-level and systematic defects, and its high resolution imaging capabilities make it capable of quickly identifying even the most subtle flaws. Its automated optical inspection platform and various remote analysis features ensure accurate and speedy inspection, and its user-friendly interface allows for easy and efficient operation of the machine.
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