Used DCG SYSTEMS / CREDENCE EmiScope I #9118942 for sale

DCG SYSTEMS / CREDENCE EmiScope I is a mask and wafer inspection equipment that utilizes latest-generation imaging technology and materials engineering processes to inspect and examine semiconductor mask and wafer substrates. This makes it possible to detect any surface defects and irregularities resulting from production, packaging, or shipping operations. CREDENCE EmiScope I system is equipped with an ultra-high resolution digital camera that captures images of mask and wafer surfaces from up to three distinct angles, allowing for detailed analysis of profile, microscopic levels of detail and the detection of defects. The unit's software provides automated defect recognition and repairs which are effective in permitting rapid imaging, recognition, and repair of defects. Automated surface-in-focus adjustment features, and automated defect detection capabilities are also included making it possible to use standard microscope objectives, xyz stages, and automated alignment systems for aligning images. DCG SYSTEMS EmiScope I machine provides data captured in several formats: monoplane movie; stereo movie; multipolar/multiplane images; polar power image; and a defect finder that can detect production errors within a given area. EmiScope I is powered by Windows XP Professional. This allows for graphical user interface (GUI) for running programs such as the 'Defect Analysis Toolbox' which makes it possible to diagnose, analyze and interpret any surface or wafer defects identified by the inspection tool. A software-based video camera allows users to monitor substrate movements and defects in real time. DCG SYSTEMS / CREDENCE EmiScope I Inspection Asset is ideal for use in a variety of settings such as research and development, laboratories, production settings, and educational facilities. It has a compact, modular design making it easily transportable, and able to be configured for any application. Additionally, it is built with an ergonomic design making it easy to use and setup. CREDENCE EmiScope I Mask and Wafer Inspection Model is a powerful, user-friendly, and cost-effective tool for the detection and repair of defects in substrates. The equipment is capable of capturing high-resolution images of both mask and wafer surfaces, and has powerful software that is able to accurately diagnose, analyze, and interpret any defects created. The system's ergonomic design, along with its compatibility with both Windows and Macintosh computer systems makes it ideal for use in labs, research and development, and in educational facilities.