Used DNS / DAINIPPON STM-602 #293655512 for sale

DNS / DAINIPPON STM-602 Mask & Wafer Inspection Equipment is a reliable, easy-to-use tool for wafer and mask inspection. The system is based on a novel algorithm which uses digital stereo microscopy. The digital stereo microscopy allows the user to view objects in 3D with top-down or side-view images. This technology enables the user to get high-quality images with very small focal step size and very fast focusing speed. The unit is mainly composed of the Image Acquisition Unit, Light Source, Power Unit, and Control Unit. The Image Acquisition Unit consists of a high-speed CMOS image sensor that captures the images of the mask or wafer. It also features a high-speed lens which can focus quickly on the mask or wafer. The Light Source includes Fluorescence Filter, Transmission Filter, Parameters Adjustable Light Source, and Reflection Filter. The Parameters Adjustable Light Source allows the user to adjust the parameters such as the intensity and color temperature of the light. Additionally, the Power Unit consists of an auto-transformer that provides stable power supply enabling smooth operation of the machine. DNS STM-602 Mask & Wafer Inspection Tool provides a combination of high-resolution and high-speed performance. It is therefore best suited for quick, accurate inspection of wafers and masks. The inspection results can be viewed in either a graph or table format. Besides, the asset enables the user to input multiple templates while maintaining a high-speed acquisition rate. The model is designed to minimize user errors and provides an easy-to-operate interface consisting of various utilities such as a Scanner portion, Mask Memory, Segmentation Memory, and Defect Detection. All these features enable the user to create an accurate and precise image for both mask and wafer inspection. Moreover, the equipment also supports several different image formats which enable the user to easily transfer their inspection results to other devices. DAINIPPON STM-602 Mask & Wafer Inspection System is extremely efficient and reliable. Its high-speed image acquisition capabilities make it ideal for high-throughput mask and wafer inspection. Additionally, its robust user-friendly interface makes it easy to use, even for inexperienced operators. All in all, it is an excellent tool for mask and wafer inspection and can help you achieve accurate results at a reasonable cost.