Used DNS / DAINIPPON STM-603-PLS #293616221 for sale

DNS (Diamond Navigation Equipment) DNS / DAINIPPON STM-603-PLS is a mask & wafer inspection system from Japan. The unit is capable of inspecting defects on masks and wafers with high accuracy and resolution. It utilizes a number of technologies such as a unique scanning machine, mounted with stereo digital cameras and a semi-conductor laser scanner. The tool is ideal for checking semiconductor wafer and mask substrate materials. The asset contains a precision substrate stage with quick, precise measurement. It makes use of scan-line and off-axis defection inspection technology to provide detailed and accurate evaluation of defects. It also incorporates the latest laser technology to achieve high-resolution scanning and defect analysis. The model is equipped with a unique automated defect classification equipment to evaluate defects without any operator intervention. The system offers a variety of integrated functions, including a 360-degree off-axis sub-pixel, multi-zoom magnification, 3D surface profile and other user-friendly features for measuring, analyzing and evaluating mask and wafer substrate components. It also offers fast and accurate alignment of wafers, by using both auto-focus and manual approach. The auto-focus algorithm ensures the optimal image focus for each layer, covering a wider range of angles. Furthermore, the unit is equipped with a 'laser mark' function to detect defective marks on masks and substrates. DNS STM-603-PLS machine also includes a unique 'quick switch' feature, allowing the tool to quickly switch between different types of surface scanning and inspection methods. This feature enables the asset to quickly inspect and analyze a variety of wafer areas with ease. The model is developed to offer the ultimate in semiconductor wafer, mask and substrate inspection, by providing greater accuracy, reliability, speed and ease-of-use than ever before. This equipment has thus become an indispensable tool in the semiconductor industry, and is capable of delivering accurate inspections, with faster feedback times, and higher throughput than ever before.