Used ESI / MICROVISION MV 852 #9111208 for sale

ESI / MICROVISION MV 852 Mask & Wafer Inspection equipment is an advanced and reliable image analysis tool that is used to inspect various types of masks and wafers. This system is designed to provide fast, efficient and reliable automated measurements of mask and wafer features while maintaining accuracy and repeatability. ESI MV 852 unit utilizes a variety of imaging technologies including high-resolution cameras and lenses, a scanning stage, and advanced image analysis software. MICROVISION MV 852 machine's high-resolution cameras and lenses are capable of capturing high-quality images of mask and wafer features, even under extreme magnification. The scanning stage allows for quick, automatic movement of the imaging device over the samples, resulting in high-speed imaging that ensures fast, accurate results. Additionally, the tool's advanced image analysis software conducts thorough, in-depth measurements of features under fixed magnification. MV 852 also includes various features to ensure precise results. The asset includes an X-Y positioning mechanism for accurately aligning the device on the samples under inspection. It also has automated calibration points that allow for optimal performance. Additionally, ESI / MICROVISION MV 852 utilizes various sample capacitance and resistance measurements to determine mask and wafer thicknesses. Furthermore, the model also includes an adjustable contrast enhancement option for optimizing image contrast. ESI MV 852 equipment has an intuitive, user-friendly graphical user interface (GUI) for convenient setup and operation. It also includes a comprehensive library of digital data that is saved in layered file format. This library includes a variety of predefined parameters that can be used to customize the device's parameters for careful details of defect inspection. The device also provides a wide selection of reporting options to meet specific requirements of the customer. MICROVISION MV 852 Mask & Wafer Inspection system is an advanced device designed to provide reliable automated measurements of mask and wafer features. Its high-resolution imaging capabilities, along with its adjustable contrast enhancement option and automated calibration points, ensure fast and precise results. Furthermore, its comprehensive library of digital data and user-friendly GUI make it a great tool for detailed defect inspection. It is an ideal device for any application requiring fast and accurate results.