Used ESI / MICROVISION MVT 7080 #138389 for sale

ESI / MICROVISION MVT 7080 is an advanced mask and wafer inspection equipment that is specifically designed for the testing of both mask and wafer defects. It is equipped with a wide range of features that help to ensure the most accurate and reliable defect detection available. The system is equipped with high resolution imaging that is capable of detecting physical, optical, chemical, and electrical defects. It is also equipped with a patented circuitry defect detection process that can detect non-visible defects. The unit has a variety of systems designed specifically for the inspection of masks and wafers. It offers both optical and non-optical microscopes that make the defects visible with an extremely high quality image. ESI MVT 7080 is also equipped with an integrated defect localizing and 3D reconstructing machine. This tool offers a high accuracy in the detection of defects on wafers or masks and also reconstructs the structure of the defective areas. The asset also features multi-sensor technology for the analysis and detection of various defect characteristics. It uses optical and electron-beam sensors to detect any defects not visible by other means. Furthermore, the model is equipped with high throughput dual volume/fitting measurement and trackable properties. MICROVISION MVT 7080 also comes with powerful defect classification and analysis software tools. This software is designed to accurately identify and classify a wide range of defects. This helps to ensure that the testing process is quicker and more accurate than ever before. Finally, the equipment features advanced automation features. It offers both full automation and semi-automated processes for defect inspection and analysis. This helps to ensure that the process is simplified and reduces the amount of time and money that is needed for the testing process. Overall, MVT 7080 is an advanced mask and wafer inspection system that offers many high tech features and technologies that help to ensure the most accurate and reliable defect detection possible. It is an ideal unit for anyone who needs to test and detect a variety of different defects on masks and wafers.