Used ESI / MICROVISION MVT 7080 #293607230 for sale

ESI / MICROVISION MVT 7080 is a mask and wafer inspection equipment designed for semiconductor inspection. It combines advanced optical and software technologies to provide high-resolution imaging for complex masks and wafers. The system can detect a range of defects, including open, short, isolated and layout defects, as well as particle, contaminants, and photomask blemishes. The unit utilizes a powerful microscope imaging machine to capture detailed images of the masks and wafers. The microscope features an 4X telecentric zoom optics and is capable of capturing high-resolution images in a repeatable manner. The imaging tool also includes filters and a light source to inspect the surface details of the masks or wafers. The image capture asset is coupled to a computer-controlled XY stage to allow for pixel-level scanning. The inspection model comes equipped with a specialized automated defect analysis tool. The analysis tool is able to detect and analyze defects using a combination of image processing algorithms. The algorithms use predefined library data to accurately determine defect-related characteristics. The software is also equipped with a user interface to allow easy manipulation of settings and automatic calculations of defect related parameters. ESI MVT 7080 was designed to be an all-in-one mask and wafer inspection equipment. It features a modular design which easily integrates with other systems, allowing for quick and easy installation. The system can also be operated remotely with network connectivity for off-site management and monitoring. It is designed for 24/7 operation and it maintains a high-degree of quality and precision. Overall, MICROVISION MVT 7080 is an advanced mask and wafer inspection unit. It combines powerful optics and software technologies to detect and analyze complex defects. The modular design makes installation and integration easy, and the machine is designed for 24/7 operation. This makes the tool an ideal choice for detecting and analyzing defects in semiconductor applications.