Used ESI / MICROVISION MVT 7080 #293626852 for sale

ESI / MICROVISION MVT 7080 is a top-of-the-line mask & wafer inspection equipment designed for the semiconductor industry. Providing precise, high-resolution imaging of patterns as small as 150 nanometers, the system provides both high quality images and precise measurements for manual inspection and review or automatic problem detection. ESI MVT 7080 is powered by sophisticated, state-of-the-art algorithms, allowing users to capture clear images of various sizes and shapes, such as lines and circles. Images are processed using high-precision estimators and inspectors which produce reliable quantitative information. This information can then be used to detect processing errors and to verify the placement of features on circuits. The unit includes two primary components: a Mask Inspection Module (MIM) and a Wafer Inspection Module (WIM). The MIM performs mask inspections at a maximum resolution of 0.6μm and a depth of field of up to 32mm. The use of advanced CCD digital imaging and patented algorithms enables the machine to identify and quantify imaging defects, even in complex mask layouts. The WIM allows for precise inspection from maximum wafer sizes of up to 200mm. Utilizing the latest Automatic Defect Detector for Wafer Inspection (ADDI), the WIM can detect and measure surface defects, pattern defects and film defects with a measurement precision of less than 30 nanometers. This highly automated tool further offers advanced algorithms for defect classification and defect resizing, allowing quality control to be performed more quickly and accurately. Finally, the asset is highly modular and expandable, allowing users to perform complex multi-stage inspections with ease. With the addition of an optional substrate stage or a large-nanoprobe station, MICROVISION MVT 7080 can be used to inspect a variety of materials, including large substrates and even nano-scale structures. MVT 7080 is an excellent choice for semiconductor professionals seeking a reliable and precise mask & wafer inspection model. This equipment provides extremely high resolution imaging, efficient data processing, automated defect detection and advanced defect classification, enabling quality control professionals to quickly and accurately detect and address manufacturing issues.