Used ESTEK / ADE AWIS 1200 #9386183 for sale

ESTEK / ADE AWIS 1200 is a highly advanced and reliable mask and wafer inspection equipment designed to detect and identify anomalies and defects on wafers and masks. It provides automated high-speed wide-field surface inspection, and has versatile pattern recognition capability, up to 6µm comparison resolution, and high-speed scanning capabilities that allow it to quickly and effectively image and detect a variety of defects. The system is designed with a compact, modular design, which enables it to be quickly and easily installed and configured for specific process requirements. The unit is also integrated with in-line advanced sensor technology that helps to facilitate advanced detection of defects on masks and wafers. It is also equipped with advanced optics and lighting systems to enable precise imaging, as well as automated wafer loading and unloading systems for efficient operation. The machine is highly reliable, providing inspection of masks and wafers with up to 6µm optical resolution. This allows the tool to accurately detect even the smallest of defects, ensuring the highest levels of quality assurance. Additionally, automated optical correction is featured in order to reduce false detects. ADE AWIS 1200 also features fully automated defect recognition capabilities. Specialized algorithmic analysis of acquired images is performed, and any defects are categorized and classified. This enables quick and precise recognition and removal of defects from the final product. Mask and wafer production time is greatly shortened, and device yields are significantly improved due to advanced defect detection and removal. ESTEK AWIS 1200 provides a user-friendly environment for operators. With intuitive menus and ergonomic interfaces, operation of the asset is simple even for users with no prior experience. Additionally, online support is available, providing users with real-time assistance. For further assurance in quality control and defect reduction, AWIS 1200 is also designed with communication capability. As many wafers and masks from distinct sources are inspected on the model, comprehensive records of the inspection results can be recorded and monitored. All in all, ESTEK / ADE AWIS 1200 is a state-of-the-art equipment for efficient and reliable mask and wafer inspection. Its highly advanced yet compact design enables it to quickly and accurately detect even the smallest anomalies and defects, as well as providing comprehensive communication capability, user-friendly environment, and automated defect recognition capabilities. With these features, the system is sure to provide the highest levels of quality assurance and improved yields.