Used ESTEK WIS-850 #293595284 for sale

ESTEK WIS-850 is an advanced vision-based mask and wafer inspection equipment designed to provide high performance inspection and review capabilities for mask and wafer images. The system combines high-resolution CCD camera technology with sophisticated image processing algorithms to rapidly inspect and detect defects in materials and structures used in microelectronics. WIS-850 is capable of inspecting nanometer-scale structures and features on wafers and masks. It can identify line patterns, feature sizes, defects, film thickness, photoresist features, and CD nonuniformities. The unit has a high depth of focus for accurate 3D image profile measurement and can integrate multi-field verification for ensuring inspection reliability and reducing yield loss. The machine uses unique inspection algorithms for defect recognition, image recognition and pattern matching. It can detect surface defects including pinholes, hydrophilic or hydrophobic defects caused by poor coatings and contaminants, as well as surface deformations caused by air-gaps. It also features a full suite of data reduction and display capabilities to allow for reliable data-driven defect analysis. The tool's statistical quality control (SQC) module allows users to compare test results with target values, monitor process performance and generate a real-time report highlighting the correlation between product quality and process performance. The module also enables dynamic multi-parameter test and categorizing of defects, as well as a magnifying lens monitoring tool. ESTEK WIS-850 also has a high accuracy wafer inspection feature that allows for rapid review of device structures without the need for individual mask and wafer images. It also has an automated particle detection and classification asset that can identify particle size, density and shape for early tool condition monitoring. The model also includes a beam de-skiver module for reducing repeat inspection, as well as advanced optical inspection algorithms for accurate defect classification of both 1D and 2D patterns. WIS-850 is a powerful mask and wafer inspection equipment comprised of sophisticated hardware and software components that help reduce process and quality control losses. The system's robust inspection and review capabilities offer users improved detection of defects, accuracy for 3D image profile measurement, multi-parameter testing, particle detection and classification, and optical inspection algorithms.