Used FEI Meridian IV #9281230 for sale

FEI Meridian IV is a state-of-the-art mask and wafer inspection equipment, optimized for critical imaging of both mask and wafer metrology applications. It has been designed for high throughput, with both high resolution detection and fault identification across a wide range of thicknesses and materials. Meridian IV features an advanced wafer inspection system, enabled by high speed algorithms and image processing technology. This unit allows for rapid analysis and fault detection on both mask and wafers, capable of detecting defects with accuracy of up to 1 nanometer and defect area of up to 10 micrometers. This level of accuracy allows for comprehensive and precise inspection of a variety of materials, from high aspect-ratio through-silicon vias to the latest advanced packaging. The machine is powered by an advanced electron optical column, combined with a high performance image acquisition tool. This combination enables users to access superior image quality, with both high magnifications and wide fields-of-view. This provides unprecedented control over the examination environment and enables users to address both simple and complex defects in a wide range of mask and wafer applications. In addition, users can access a range of automated programmable capabilities, such as defect mapping, alignment/registration, fault analysis, and critical value analysis. This allows for accurate and reliable results, enabling users to make informed decisions on defect status, equipment maintenance, process optimization, and process qualification. The asset also includes a core defect library featuring standard defect directions, enabling users to quickly build and store multiple processes and defect database configurations. FEI Meridian IV systems also feature a range of performance capabilities, including a wide array of imaging modes to provide exceptionally detailed images, as well as fast throughput. It also includes support for fast batch processing for automated, high throughput analysis of large volumes of data. Overall, Meridian IV is an advanced, highly versatile mask and wafer inspection model, suitable for a wide range of metrology applications. It offers unparalleled accuracy, wide range of imaging capabilities, automated programmable features, and fast throughput, all at a reasonable cost. It is ideal for helping users capture the most data from their application needs, enabling high precision and accuracy in metrology measurements.