Used FUJI Fujinon R10 #9157658 for sale

FUJI Fujinon R10 is a fully automated mask and wafer inspection equipment specifically designed to meet the high performance requirements of production inspection of masks and wafers. The system combines proprietary CCD sensors, advanced optical systems, and direct drive scanning stages for quick inspection of a variety of features. The main hardware components of Fujinon R10 include the optical head, direct drive scanning stages, ccd cameras, image processing board, and software controller. The optical head contains two types of optics - a stereo microscope and a telecentric lens- allowing the unit to simultaneously inspect multiple areas of mask/wafer and accurately locate edge defects and other irregularities. The direct drive scanning stages provide fast and accurate positioning, enabling high speed scanning times. The CCD camera provides high resolution imaging, allowing the machine to detect small defects that would otherwise be missed with traditional inspection techniques. The image processing board enables simultaneous inspection of multiple areas, and the software controller is used to configure settings for optimum performance. The main inspection capabilities of FUJI Fujinon R10 include: detecting and measuring small features, such as trace defects; recognizing features using pattern recognition algorithms; locating edge defects; visualizing the inspected features on a computer monitor; and analyzing images. The tool also has a powerful post-processing suite, allowing users to quickly and easily identify and mark off defects and other irregularities on the images. Fujinon R10 is an ideal solution for production inspection of masks and wafers. With its combination of advanced optics, fast scanning speeds, and high resolution imaging, the asset is able to reliably detect and identify small features with exceptional accuracy. Moreover, the post-processing software enables fast and efficient evaluation of images and streamlined analysis of defects. FUJI Fujinon R10 provides a cost-effective and high-performance solution for production inspection of masks and wafers.