Used GCA / TROPEL L-35 #128047 for sale

GCA / TROPEL L-35 mask & wafer inspection equipment is a powerful imaging and inspection system that combines digital imaging with ideal optics to allow for the detailed inspection of multi-layer masks and wafers of all sizes. The unit is designed to meet the technology demands of cutting-edge microelectronics applications. It features advanced hardware components such as a motorized XYZ stage, high resolution color camera, line scan camera, and a range of lenses, all combined to provide superior performance. The machine utilizes sophisticated imaging techniques such as bright field pattern recognition, line offset detection, and contrast enhancement to detect and identify subtle defects on masks or wafers. It has the capacity to process additive and subtractive color images, and can detect various features including pinholes, bridging, foreign particles, knife-edge defects, and overall clarity. With the tool's integrated segmentation options, it can quickly and accurately identify objects across a range of sizes and surfaces. GCA L-35 is equipped with a monochrome and dual-color LED backlight source that ensures optimal illumination and contrast levels. The light source is adjustable in color, brightness, intensity, and LED color mix to match the requirements of any specific job. The asset also supports the ability to store captured images as well as save image results for report generation. TROPEL L-35 saves critical time and money for mask and wafer inspection. It ensures efficient operation during production, with a high degree of repeatability and process reliability. All settings can be saved to the model for future use, fine-tuned for each unique application. Also, the equipment comes with an intuitive and user-friendly software interface, allowing for easy access and functionality. L-35 can also be used as a fully automated inspection system for advanced laboratory applications. An integrated computer vision unit is capable of driving the XYZ stage to a target position while imaging wafer features, defect inspection, and automated defect classification. With the ability of isolated defect detection, feature identification, and comparison to CAD data, GCA / TROPEL L-35 offers an accurate and comprehensive solution for microelectronics mask and wafer inspection.