Used GOMEZ Cylinder #117632 for sale

GOMEZ Cylinder is an advanced mask and wafer inspection equipment designed for high-precision image inspection of transistors, capacitors and other microscopic components. The system is used for the inspection of a broad range of semiconductor chips and other small electronics components prior to their fabrication. The unit utilizes two cylindrical scanning systems to simultaneously explore the entire mask or wafer. It is equipped with two high-precision ProScan scanning stages and two ProVu imaging cameras. The stages offer 360° scanning in the X and Y planes and a full 294° scan in the Z-axis. Both the imaging cameras and the stages are optically decoupled, ensuring a highly accurate, distortion-free image of the mask or wafer. The machine is equipped with advanced image processing software, featuring a range of pattern recognition and optical defect detection capabilities. This makes it ideal for the identification and categorization of defects, enabling the user to quickly analyze and identify any pattern anomalies. Furthermore, Cylinder includes an effective alignment correction tool which automatically calibrates the imaging cameras to adjust and compensate for any alignment errors. This ensures higher quality imaging, enabling users to accurately detect small defects and eliminate potential issues before components are put into production. The user-friendly interface and intuitive control asset make this model perfect for quick and easy operation. The large monitor allows easy selection of components for inspection and with the automated reporting, users can quickly and easily generate detailed reports on post-inspection performance. Robust yet lightweight in design, GOMEZ Cylinder is designed for long-term reliability and has been thoroughly tested in real-world conditions, ensuring long-term performance and high-precision imaging. Overall, Cylinder is an advanced mask and wafer inspection equipment which offers reliable, distortion-free imaging, an intuitive interface and robust alignment correction, providing users with an effective solution for inspecting and categorizing pattern anomalies in a wide range of semiconductor components.