Used HERMES MICROVISION / HMI eScan 315xp #293595412 for sale

HERMES MICROVISION / HMI eScan 315xp is a powerful, advanced mask and wafer inspection equipment designed to provide automated, high-precision optical inspection of small-scale semiconductor components. The system boasts a host of features, including full-frame imaging resolution of up to 10 nm, superior image acquisition and image analysis capability, ultra-fast sample scan times, and several advanced software tools and options. HMI eScan 315xp utilizes a state-of-the-art optical unit, consisting of a 190nm deep UV light source, a microscope objective and a high-resolution digital camera. The machine offers superior imaging performance due to its ultra-sensitive optical tool, allowing for high-precision imaging of structures down to 10nm. The asset's advanced imaging algorithms provide high-speed image capture and analysis and exceptional image contrast, making it ideal for a range of wafer inspection and print-line recognition needs. HERMES MICROVISION eScan 315xp also comes with a suite of automated software tools. These include advanced mask inspection, substrate inspection, and defect detection tools. The mask inspection tool allows for the rapid and automated detection of defects in photomask patterns, while the substrate inspection tool allows for the accurate on-board detection of critical defects in photolithography substrates. The model's defect detection tool can be used to identify yield-critical defects in both film and silicon layers, and can provide detailed analysis and reporting on wafer-specific defect coverage. The equipment also features a range of built-in features. These include programmable scan rates, sensitive data archiving, and system-wide error handling. The advanced scan rate feature allows for faster scanning, while the data archiving feature ensures that acquired image data can be stored safely and securely. The unit's error handling systems make it ideal for use in mission critical applications, providing failsafe protection from potential catastrophic events. EScan 315xp is an incredibly powerful and versatile mask and wafer inspection machine designed for superior performance in a range of applications. Its combination of optical precision, imaging performance, advanced software tools, and useful features make it an invaluable tool for semiconductor component inspection and testing.