Used HERMES MICROVISION / HMI eScan 320 #293638912 for sale

HERMES MICROVISION / HMI eScan 320 is a state-of-the-art mask and wafer inspection equipment that provides a level of accuracy and speed unmatched by other traditional imaging systems. HMI eScan 320 has a built-in optical microscope with 20x digital zoom, a 2048 x 1536 pixel resolution Charge-Coupled Device (CCD) imaging sensor, and dynamic focus that can detect defects down to 2μm. It is equipped with image processing algorithms that allow for quick capture and comparison of multiple images for superior defect detection accuracy. HERMES MICROVISION eScan 320 has a user-friendly and intuitive user interface that is designed to simplify the operational process, and its color-coded image presentation allows users to easily identify, mark and sort through the obtained data. Furthermore, the system is highly configurable and allows the user to customize the scan type and settings which include, but are not limited to, pixel rate adjustments and built-in support for multiple wafer and mask types. EScan 320 has several other features that make it an ideal choice for a variety of applications. Its proprietary autofocus feature ensures high-quality images independent of image or distance movement. With an enhanced Sub-Pixel Image Measurement Unit, image fidelity and accuracy are both improved. Additionally, the unit uses a sophisticated optical algorithm for micro crevice detection to aid in the detection of faulted devices prior to entering production. The software associated with HERMES MICROVISION / HMI eScan 320 features on-demand defect classification, custom mask polarity comparison, a library of customizable masks and minimal false alarm rates. It also runs on a 64-bit Intel processor, providing exceptional performance and improved machine stability. A multi-axis linear certification support tool ensures that proper lens alignment is always maintained and functions as an effective method of maintaining asset accuracy over extended periods. With its advanced MetaImage Analysis software and 4K precision scanner, HMI eScan 320 is the perfect choice for superior pattern wafer inspections and chip-level defect identification. Moreover, the automated defect reference library provides the user with an interactive platform to store information on known yield-decreasing defect patterns. In conclusion, HERMES MICROVISION eScan 320 is an invaluable tool for mask or wafer inspection. This model is designed to provide users with high-accuracy and high-speed imaging, while its intuitive user interface and advanced software make eScan 320 an ideal solution for a wide variety of inspection needs.