Used HERMES MICROVISION / HMI eScan 320 #293667460 for sale

HERMES MICROVISION / HMI eScan 320 is a mask and wafer inspection equipment that offers reliable, accurate, and high precision imaging. It is a fully automated, high-speed system which enables users to obtain maximum throughput in the inspection of a wide variety of wafer technologies and substrates. HMI eScan 320 utilizes laser powered quadrant photomask inspection technology to detect and measure defects on masks, wafers, and substrates. It features an intuitive mask and wafer inspection interface which enables users to create real-time visualizations of substrates using an industrial grade laser light source. Its advanced Quadrant Photomask Inspection Session (QPIS) allows users to quickly and accurately measure the critical parameters of a given wafer or substrate. HERMES MICROVISION eScan 320 provides fast and accurate alignment and positioning capabilities, making it perfect for challenging applications such as electron beam lithography. It also supports a number of image analysis tools, allowing users to detect and analyze defects on a variety of materials without the need for direct contact. EScan 320 offers a broad range of mask and wafer imaging capabilities. These include bright field, dark field, photomask, and plating imaging capabilities. Its imaging capabilities combined with the powerful and accurate defects detection capabilities make it a perfect solution for mask fabrication and wafer inspection applications. HERMES MICROVISION / HMI eScan 320 also features a broad range of image processing capabilities. Users can apply custom algorithms and parameters to improve the accuracy of detected defects. It also features a library of pre-processed mask images which enable users to quickly evaluate the accuracy of detected defects. HMI eScan 320 is a highly reliable mask and wafer inspection unit. Its simple user interface and fast processing capabilities make it easy for users to configure and control the inspection process. It is a powerful machine which allows users to optimally inspect masks and wafers to ensure the quality of critical components.