Used HERMES MICROVISION / HMI eScan 400 #293666956 for sale

HERMES MICROVISION / HMI eScan 400
ID: 293666956
E-Beam defect inspection system.
HERMES MICROVISION / HMI eScan 400 is a high performance, precision mask and wafer inspection equipment designed for semiconductor manufacturers. This advanced system can detect small defects in advanced design masks and wafers for 100-millions of pixel inspects per second speed. HMI eScan 400 is equipped with a powerful laser spectrometer that provides superior defect detection and pattern recognition capabilities, and a high-resolution CCD camera that ensures accurate defect measurements and analysis. This unit also uses 3D imaging technology, which is capable of detecting and quantifying defects even at the nanometer level. Through the use of pattern recognition algorithms, HERMES MICROVISION eScan 400 can detect very small irregularities and contaminants in the mask and wafer material. The machine also incorporates a variety of automated test functions, such as automated edge analysis, contamination detection, and defect density analysis, which helps to minimize time and costs associated with the inspection process. In addition, the automated process allows for faster processing and analysis of large volumes of data while still ensuring a high level of accuracy. EScan 400 is built to be modular and extensible to meet future demands as well as to handle a variety of tasks. Its automated position sensing tool allows it to accurately detect, measure, and report on defects in a variety of shapes, sizes, and materials. In addition, this asset utilizes a flexible software platform, allowing for programming of additional tasks and customization of analysis. HERMES MICROVISION / HMI eScan 400 is revolutionizing the mask and wafer inspection process. Its high performance and precision, combined with a cost effective and robust design, make it the ideal model for semiconductor manufacturers.
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